| 000 | 01321 a2200289 4500 | ||
|---|---|---|---|
| 005 | 20250514195453.0 | ||
| 264 | 0 | _c20040916 | |
| 008 | 200409s 0 0 eng d | ||
| 022 | _a1431-9276 | ||
| 024 | 7 |
_a10.1017/S1431927604040413 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aGasser, Philippe | |
| 245 | 0 | 0 |
_aSite-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. _h[electronic resource] |
| 260 |
_bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _cApr 2004 |
||
| 300 |
_a311-6 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 650 | 0 | 4 |
_aMetals _xchemistry |
| 650 | 0 | 4 |
_aMicroscopy, Electron _xmethods |
| 650 | 0 | 4 |
_aMicroscopy, Electron, Scanning _xmethods |
| 650 | 0 | 4 | _aModels, Molecular |
| 650 | 0 | 4 |
_aResins, Synthetic _xchemistry |
| 700 | 1 | _aKlotz, Ulrich E | |
| 700 | 1 | _aKhalid, Fazal A | |
| 700 | 1 | _aBeffort, Olivier | |
| 773 | 0 |
_tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _gvol. 10 _gno. 2 _gp. 311-6 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1017/S1431927604040413 _zAvailable from publisher's website |
| 999 |
_c15005419 _d15005419 |
||