000 | 01029 a2200289 4500 | ||
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005 | 20250514155959.0 | ||
264 | 0 | _c20031107 | |
008 | 200311s 0 0 eng d | ||
022 | _a1559-128X | ||
024 | 7 |
_a10.1364/ao.42.005670 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aDecker, Jennifer E | |
245 | 0 | 0 |
_aIncreasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement. _h[electronic resource] |
260 |
_bApplied optics _cOct 2003 |
||
300 |
_a5670-8 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aMiles, John R | |
700 | 1 | _aMadej, Alan A | |
700 | 1 | _aSiemsen, Ralph F | |
700 | 1 | _aSiemsen, Klaus J | |
700 | 1 | _ade Bonth, Sebastian | |
700 | 1 | _aBustraan, Krijn | |
700 | 1 | _aTemple, Sara | |
700 | 1 | _aPekelsky, James R | |
773 | 0 |
_tApplied optics _gvol. 42 _gno. 28 _gp. 5670-8 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1364/ao.42.005670 _zAvailable from publisher's website |
999 |
_c14288607 _d14288607 |