000 01029 a2200289 4500
005 20250514155959.0
264 0 _c20031107
008 200311s 0 0 eng d
022 _a1559-128X
024 7 _a10.1364/ao.42.005670
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aDecker, Jennifer E
245 0 0 _aIncreasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement.
_h[electronic resource]
260 _bApplied optics
_cOct 2003
300 _a5670-8 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aMiles, John R
700 1 _aMadej, Alan A
700 1 _aSiemsen, Ralph F
700 1 _aSiemsen, Klaus J
700 1 _ade Bonth, Sebastian
700 1 _aBustraan, Krijn
700 1 _aTemple, Sara
700 1 _aPekelsky, James R
773 0 _tApplied optics
_gvol. 42
_gno. 28
_gp. 5670-8
856 4 0 _uhttps://doi.org/10.1364/ao.42.005670
_zAvailable from publisher's website
999 _c14288607
_d14288607