| 000 | 01202 a2200349 4500 | ||
|---|---|---|---|
| 005 | 20250514060711.0 | ||
| 264 | 0 | _c20030411 | |
| 008 | 200304s 0 0 eng d | ||
| 022 | _a0022-2720 | ||
| 024 | 7 |
_a10.1046/j.1365-2818.2003.01105.x _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMcDonald, S A | |
| 245 | 0 | 0 |
_aX-ray tomographic imaging of Ti/SiC composites. _h[electronic resource] |
| 260 |
_bJournal of microscopy _cFeb 2003 |
||
| 300 |
_a102-12 p. _bdigital |
||
| 500 | _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 | _aAlloys |
| 650 | 0 | 4 |
_aCarbon Compounds, Inorganic _xchemistry |
| 650 | 0 | 4 | _aComposite Resins |
| 650 | 0 | 4 | _aMaterials Testing |
| 650 | 0 | 4 |
_aSilicon Compounds _xchemistry |
| 650 | 0 | 4 | _aSurface Properties |
| 650 | 0 | 4 |
_aTitanium _xchemistry |
| 650 | 0 | 4 |
_aTomography, X-Ray Computed _xmethods |
| 700 | 1 | _aPreuss, M | |
| 700 | 1 | _aMaire, E | |
| 700 | 1 | _aBuffiere, J-Y | |
| 700 | 1 | _aMummery, P M | |
| 700 | 1 | _aWithers, P J | |
| 773 | 0 |
_tJournal of microscopy _gvol. 209 _gno. Pt 2 _gp. 102-12 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1046/j.1365-2818.2003.01105.x _zAvailable from publisher's website |
| 999 |
_c12385804 _d12385804 |
||