000 00748 a2200229 4500
005 20250514052713.0
264 0 _c20021227
008 200212s 0 0 eng d
022 _a0028-0836
024 7 _a10.1038/420378a
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aAlam, Muhammad A
245 0 0 _aThin dielectric films: Uncorrelated breakdown of integrated circuits.
_h[electronic resource]
260 _bNature
_cNov 2002
300 _a378 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aSmith, R Kent
700 1 _aWeir, Bonnie E
700 1 _aSilverman, Paul J
773 0 _tNature
_gvol. 420
_gno. 6914
_gp. 378
856 4 0 _uhttps://doi.org/10.1038/420378a
_zAvailable from publisher's website
999 _c12265591
_d12265591