000 00770 a2200217 4500
005 20250514032501.0
264 0 _c20020627
008 200206s 0 0 eng d
022 _a0022-2720
024 7 _a10.1046/j.1365-2818.2002.01008.x
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aAronsson, M
245 0 0 _aMinimizing scanning electron microscope artefacts by filter design.
_h[electronic resource]
260 _bJournal of microscopy
_cApr 2002
300 _a84-92 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aSavborg, O
700 1 _aBorgefors, G
773 0 _tJournal of microscopy
_gvol. 206
_gno. Pt 1
_gp. 84-92
856 4 0 _uhttps://doi.org/10.1046/j.1365-2818.2002.01008.x
_zAvailable from publisher's website
999 _c11899605
_d11899605