| 000 | 00924 a2200265 4500 | ||
|---|---|---|---|
| 005 | 20250514031143.0 | ||
| 264 | 0 | _c20020513 | |
| 008 | 200205s 0 0 eng d | ||
| 022 | _a0031-9007 | ||
| 024 | 7 |
_a10.1103/PhysRevLett.88.156101 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aEastman, D E | |
| 245 | 0 | 0 |
_aObservation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction. _h[electronic resource] |
| 260 |
_bPhysical review letters _cApr 2002 |
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| 300 |
_a156101 p. _bdigital |
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| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aStagarescu, C B | |
| 700 | 1 | _aXu, G | |
| 700 | 1 | _aMooney, P M | |
| 700 | 1 | _aJordan-Sweet, J L | |
| 700 | 1 | _aLai, B | |
| 700 | 1 | _aCai, Z | |
| 773 | 0 |
_tPhysical review letters _gvol. 88 _gno. 15 _gp. 156101 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1103/PhysRevLett.88.156101 _zAvailable from publisher's website |
| 999 |
_c11857889 _d11857889 |
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