| 000 | 00845 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250514005525.0 | ||
| 264 | 0 | _c20010906 | |
| 008 | 200109s 0 0 eng d | ||
| 022 | _a0909-0495 | ||
| 024 | 7 |
_a10.1107/s0909049501001248 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aCheong, S K | |
| 245 | 0 | 0 |
_aXAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces. _h[electronic resource] |
| 260 |
_bJournal of synchrotron radiation _cMar 2001 |
||
| 300 |
_a824-6 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aBunker, B A | |
| 700 | 1 | _aHall, D C | |
| 700 | 1 | _aSnider, G L | |
| 700 | 1 | _aBarrios, P J | |
| 773 | 0 |
_tJournal of synchrotron radiation _gvol. 8 _gno. Pt 2 _gp. 824-6 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1107/s0909049501001248 _zAvailable from publisher's website |
| 999 |
_c11437595 _d11437595 |
||