| 000 | 00790 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250514005022.0 | ||
| 264 | 0 | _c20010913 | |
| 008 | 200109s 0 0 eng d | ||
| 022 | _a0031-9007 | ||
| 024 | 7 |
_a10.1103/PhysRevLett.87.056801 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aAltfeder, I B | |
| 245 | 0 | 0 |
_aConfinement-enhanced electron transport across a metal-semiconductor interface. _h[electronic resource] |
| 260 |
_bPhysical review letters _cJul 2001 |
||
| 300 |
_a056801 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aGolovchenko, J A | |
| 700 | 1 | _aNarayanamurti, V | |
| 773 | 0 |
_tPhysical review letters _gvol. 87 _gno. 5 _gp. 056801 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1103/PhysRevLett.87.056801 _zAvailable from publisher's website |
| 999 |
_c11423075 _d11423075 |
||