| 000 | 00848 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250514003731.0 | ||
| 264 | 0 | _c20020823 | |
| 008 | 200208s 0 0 eng d | ||
| 022 | _a0022-2720 | ||
| 024 | 7 |
_a10.1046/j.1365-2818.2001.00911.x _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aSasaki, K | |
| 245 | 0 | 0 |
_aDynamic chemical mapping near a Si/SiO2 interface at elevated temperatures using plasmon-loss images. _h[electronic resource] |
| 260 |
_bJournal of microscopy _cJul 2001 |
||
| 300 |
_a12-6 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aTsukimoto, S | |
| 700 | 1 | _aKonno, M | |
| 700 | 1 | _aKamino, T | |
| 700 | 1 | _aSaka, H | |
| 773 | 0 |
_tJournal of microscopy _gvol. 203 _gno. Pt 1 _gp. 12-6 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1046/j.1365-2818.2001.00911.x _zAvailable from publisher's website |
| 999 |
_c11382466 _d11382466 |
||