| 000 | 00731 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250513234635.0 | ||
| 264 | 0 | _c20010524 | |
| 008 | 200105s 0 0 eng d | ||
| 022 | _a0031-9007 | ||
| 024 | 7 |
_a10.1103/PhysRevLett.86.1793 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aJin, Y G | |
| 245 | 0 | 0 |
_aMechanism for the enhanced diffusion of charged oxygen ions in SiO2. _h[electronic resource] |
| 260 |
_bPhysical review letters _cFeb 2001 |
||
| 300 |
_a1793-6 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aChang, K J | |
| 773 | 0 |
_tPhysical review letters _gvol. 86 _gno. 9 _gp. 1793-6 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1103/PhysRevLett.86.1793 _zAvailable from publisher's website |
| 999 |
_c11225531 _d11225531 |
||