000 | 01208 a2200313 4500 | ||
---|---|---|---|
005 | 20250513211418.0 | ||
264 | 0 | _c20000710 | |
008 | 200007s 0 0 eng d | ||
022 | _a1059-910X | ||
024 | 7 |
_a10.1002/(SICI)1097-0029(20000501)49:3<281::AID-JEMT6>3.0.CO;2-A _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aBele, P | |
245 | 0 | 0 |
_aNew high-DQE imaging plate scanner using the reflected readout laser signal for noise corrections. _h[electronic resource] |
260 |
_bMicroscopy research and technique _cMay 2000 |
||
300 |
_a281-91 p. _bdigital |
||
500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
650 | 0 | 4 | _aBiophysical Phenomena |
650 | 0 | 4 | _aBiophysics |
650 | 0 | 4 |
_aImage Enhancement _xmethods |
650 | 0 | 4 |
_aImage Processing, Computer-Assisted _xmethods |
650 | 0 | 4 | _aLasers |
650 | 0 | 4 | _aLight |
650 | 0 | 4 |
_aMicroscopy, Electron _xinstrumentation |
700 | 1 | _aOchs, R | |
700 | 1 | _aAngert, I | |
700 | 1 | _aSchröder, R R | |
773 | 0 |
_tMicroscopy research and technique _gvol. 49 _gno. 3 _gp. 281-91 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1002/(SICI)1097-0029(20000501)49:3<281::AID-JEMT6>3.0.CO;2-A _zAvailable from publisher's website |
999 |
_c10767992 _d10767992 |