| 000 | 01171 a2200301 4500 | ||
|---|---|---|---|
| 005 | 20250513190233.0 | ||
| 264 | 0 | _c19990922 | |
| 008 | 199909s 0 0 eng d | ||
| 022 | _a1059-910X | ||
| 024 | 7 |
_a10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aHolmestad, R | |
| 245 | 0 | 0 |
_aUse of quantitative convergent-beam electron diffraction in materials science. _h[electronic resource] |
| 260 |
_bMicroscopy research and technique _cJul 1999 |
||
| 300 |
_a130-45 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review | ||
| 650 | 0 | 4 | _aAlloys |
| 650 | 0 | 4 | _aMaterials Testing |
| 650 | 0 | 4 | _aMetals |
| 650 | 0 | 4 |
_aMicroscopy, Electron _xinstrumentation |
| 650 | 0 | 4 | _aSemiconductors |
| 700 | 1 | _aBirkeland, C R | |
| 700 | 1 | _aMarthinsen, K | |
| 700 | 1 | _aHøier, R | |
| 700 | 1 | _aZuo, J M | |
| 773 | 0 |
_tMicroscopy research and technique _gvol. 46 _gno. 2 _gp. 130-45 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O _zAvailable from publisher's website |
| 999 |
_c10381521 _d10381521 |
||