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Results of search for 'su:"Electron Probe Microanalysis"', page 1 of 316
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Authors
Berry, J P
Cameron, I L
Campos, A
Dörge, A
Forslind, B
Galle, P
Hall, T A
Höhling, H J
Ingram, P
Kirk, R G
Rick, R
Roomans, G M
Saubermann, A J
Smith, N K
Somlyo, A P
Somlyo, A V
Thurau, K
Warley, A
Wróblewski, R
Zierold, K
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Topics
Animals
Calcium
Electron Probe Microanalysis
Female
Humans
Male
Microscopy, Electron
Microscopy, Electron, Scanning
Phosphorus
Potassium
Rats
Surface Properties
analysis
chemistry
drug effects
metabolism
methods
pathology
pharmacology
ultrastructure
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Results
1.
[X-ray microscope].
[electronic resource]
by
Majima, T
Shimizu, H
Tomie, T
Kanayama, T
Yamada, M
Producer:
19970722
In:
Tanpakushitsu kakusan koso. Protein, nucleic acid, enzyme
vol. 42
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2.
Experimental conditions for surface microanalysis with reflection electron energy-loss spectroscopy.
[electronic resource]
by
Wang, Z L
Producer:
19890315
In:
Journal of electron microscopy technique
vol. 11
Online resources:
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3.
The effect of large solid angles of collection on quantitative X-ray microanalysis in the AEM.
[electronic resource]
by
Watanabe, M
Ackland, D W
Williams, D B
Producer:
19990826
In:
Journal of microscopy
vol. 195
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4.
[Introduction of electron probe x-ray microanalyser].
[electronic resource]
by
Nakano, T
Producer:
19710914
In:
Kokubyo Gakkai zasshi. The Journal of the Stomatological Society, Japan
vol. 38
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5.
Applications of synchrotron-based X-ray microprobes.
[electronic resource]
by
Bertsch, P M
Hunter, D B
Producer:
20011207
In:
Chemical reviews
vol. 101
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6.
Advances in analytical electron microscopy: Part I.
[electronic resource]
Producer:
19890126
In:
Journal of electron microscopy technique
vol. 9
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7.
Capabilities and limitations of probe methods for the microanalysis of chemical elements in biology: a brief introduction.
[electronic resource]
by
Hall, T A
Producer:
19880506
In:
Ultramicroscopy
vol. 24
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8.
X-ray microanalysis techniques.
[electronic resource]
by
Morgan, A J
Winters, C
Stürzenbaum, S
Producer:
19990629
In:
Methods in molecular biology (Clifton, N.J.)
vol. 117
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9.
Determination of conditions for optimum resolution of a high angle thin window energy dispersive spectrometer.
[electronic resource]
by
Blackford, M G
Smith, K L
Producer:
19920924
In:
Microscopy research and technique
vol. 22
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10.
Optical flats for use in x-ray spectrochemical microanalysis.
[electronic resource]
by
Yoneda, Y
Horiuchi, T
Producer:
19720102
In:
The Review of scientific instruments
vol. 42
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11.
Development of extended X-ray absorption fine structure spectroelectrochemistry and its application to structural studies of transition-metal ions in aqueous solution.
[electronic resource]
by
Dewald, H D
Watkins, J W
Elder, R C
Heineman, W R
Producer:
19870313
In:
Analytical chemistry
vol. 58
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12.
Introduction to X-ray microanalysis in biology.
[electronic resource]
by
Roomans, G M
Producer:
19890126
In:
Journal of electron microscopy technique
vol. 9
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13.
Electrochemical and electron spectroscopic studies of highly polished glassy carbon electrodes.
[electronic resource]
by
Kamau, G N
Willis, W S
Rusling, J F
Producer:
19850409
In:
Analytical chemistry
vol. 57
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14.
Background determination in x-ray microanalysis of biological thin sections.
[electronic resource]
by
Roomans, G M
Kuypers, G A
Producer:
19800815
In:
Ultramicroscopy
vol. 5
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15.
Diagnosing pure-electron plasmas with internal particle flux probes.
[electronic resource]
by
Kremer, J P
Pedersen, T Sunn
Marksteiner, Q
Lefrancois, R G
Hahn, M
Producer:
20070622
In:
The Review of scientific instruments
vol. 78
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16.
Chemi-refiner mechanical pulping of flax shives: refining energy and fiber properties.
[electronic resource]
by
Sain, Mohini
Fortier, David
Lampron, Eric
Producer:
20020625
In:
Bioresource technology
vol. 81
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17.
Quantitative electron probe microanalysis of biological thin sections: the use of stem for measurement of local mass thickness.
[electronic resource]
by
Halloran, B P
Kirk, R G
Spurr, A R
Producer:
19781202
In:
Ultramicroscopy
vol. 3
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18.
Determination of experimental and theoretical kASi factors for a 200-kV analytical electron microscope.
[electronic resource]
by
Sheridan, P J
Producer:
19890315
In:
Journal of electron microscopy technique
vol. 11
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19.
Introduction: a special issue on nanoscale characterization using atom probe field ion microscopy.
[electronic resource]
by
Larson, D J
Producer:
20040903
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 10
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20.
On the use of ionization cross sections in analytical electron microscopy.
[electronic resource]
by
Williams, D B
Newbury, D E
Goldstein, J I
Fiori, C E
Producer:
19850221
In:
Journal of microscopy
vol. 136
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