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	1.	A subsurface add-on for standard atomic force microscopes. [electronic resource] by Verbiest, G J van der Zalm, D J Oosterkamp, T H Rost, M J Producer: 20150522 In: The Review of scientific instruments vol. 86 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	A compact multipurpose nanomanipulator for use inside a scanning electron microscope. [electronic resource] by Heeres, E C Katan, A J van Es, M H Beker, A F Hesselberth, M van der Zalm, D J Oosterkamp, T H Producer: 20100601 In: The Review of scientific instruments vol. 81 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Atomic resolution scanning tunneling microscopy in a cryogen free dilution refrigerator at 15 mK. [electronic resource] by den Haan, A M J Wijts, G H C J Galli, F Usenko, O van Baarle, G J C van der Zalm, D J Oosterkamp, T H Producer: 20160321 In: The Review of scientific instruments vol. 85 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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