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	1.	Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection. [electronic resource] by Sadeghian, Hamed Herfst, Rodolf Winters, Jasper Crowcombe, Will Kramer, Geerten van den Dool, Teun van Es, Maarten H Producer: 20160317 In: The Review of scientific instruments vol. 86 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Characterization of a photonic strain sensor in silicon-on-insulator technology. [electronic resource] by Westerveld, Wouter J Pozo, Jose Harmsma, Peter J Schmits, Ruud Tabak, Erik van den Dool, Teun C Leinders, Suzanne M van Dongen, Koen W A Urbach, H Paul Yousefi, Mirvais Producer: 20120625 In: Optics letters vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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