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	1.	Signal modeling for low-coherence height-scanning interference microscopy. [electronic resource] by de Groot, Peter de Lega, Xavier Colonna Producer: 20041012 In: Applied optics vol. 43 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry. [electronic resource] by de Groot, Peter de Lega, Xavier Colonna Producer: 20070820 In: Optics letters vol. 32 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Optical interferometry for measurement of the geometric dimensions of industrial parts. [electronic resource] by de Groot, Peter Biegen, Jim Clark, Jack de Lega, Xavier Colonna Grigg, David Producer: 20020724 In: Applied optics vol. 41 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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