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Results of search for 'au:"de Korte, P A"'
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Authors
Brinkman, A C
Contet, J J
Coste, J N
Dijkstra, J H
Ernu, C
Flamand, J
Frindel, S
Geerlings, W F
Giralt, R
Lainé, R
Timmerman, C
de Korte, P A
van Rooijen, F A
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1.
High-throughput replica optics.
[electronic resource]
by
de Korte, P A
Producer:
20121002
In:
Applied optics
vol. 27
Online resources:
Available from publisher's website
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No items available.
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2.
Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy.
[electronic resource]
by
de Korte, P A
Lainé, R
Producer:
20121002
In:
Applied optics
vol. 18
Online resources:
Available from publisher's website
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No items available.
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3.
EXOSAT x-ray imaging optics.
[electronic resource]
by
de Korte, P A
Giralt, R
Coste, J N
Ernu, C
Frindel, S
Flamand, J
Contet, J J
Producer:
20121002
In:
Applied optics
vol. 20
Online resources:
Available from publisher's website
Availability:
No items available.
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4.
Efficiency and resolution measurements of x-ray transmission gratings between 7.1 and 304 A.
[electronic resource]
by
Brinkman, A C
Dijkstra, J H
Geerlings, W F
van Rooijen, F A
Timmerman, C
de Korte, P A
Producer:
20121002
In:
Applied optics
vol. 19
Online resources:
Available from publisher's website
Availability:
No items available.
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