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	1.	Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction. [electronic resource] by Zuo, J M Producer: 19990921 In: Microscopy research and technique vol. 46 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration. [electronic resource] by Zuo, J M Producer: 20000710 In: Microscopy research and technique vol. 49 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Nanostructure evolution during cluster growth: Ag on H-terminated Si(111) surfaces. [electronic resource] by Zuo, J M Li, B Q Producer: 20020813 In: Physical review letters vol. 88 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Solving difficult structures with electron diffraction. [electronic resource] by Zuo, J M Rouviére, J L Producer: 20150122 In: IUCrJ vol. 2 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	FORTRAN source listing for simulating three-dimensional convergent beam patterns with absorption by the Bloch wave method. [electronic resource] by Zuo, J M Gjonnes, K Spence, J C Producer: 19890901 In: Journal of electron microscopy technique vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Induced growth of asymmetric nanocantilever arrays on polar surfaces. [electronic resource] by Wang, Z L Kong, X Y Zuo, J M Producer: 20031223 In: Physical review letters vol. 91 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	[Observation on the effect of five years' prevention and treatment of schistosomiasis in Nanjian mountain area]. [electronic resource] by Bi, S Y Zuo, J M Zhao, W H Producer: 20030916 In: Zhongguo ji sheng chong xue yu ji sheng chong bing za zhi = Chinese journal of parasitology & parasitic diseases vol. 18 Availability: No items available. Save to lists Add to cart (remove)
	8.	Quantitative electron diffraction evidence for one-dimensional ordering in magnetite above the Verwey transition. [electronic resource] by Pacaud, J Zuo, J M Hoier, R Matsumura, S Producer: 20091006 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Composition analysis of semiconductor quantum wells by energy filtered convergent-beam electron diffraction. [electronic resource] by Jacob, D Zuo, J M Lefebvre, A Cordier, Y Producer: 20080417 In: Ultramicroscopy vol. 108 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Lamellar phase separation and dynamic competition in La0.23Ca0.77MnO3. [electronic resource] by Tao, J Niebieskikwiat, D Salamon, M B Zuo, J M Producer: 20050616 In: Physical review letters vol. 94 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Orbital ordering in LaMnO3: estimates of structure factors and comparison of measurement methods. [electronic resource] by Jiang, B Zuo, J M Chen, Q Spence, J C H Producer: 20020426 In: Acta crystallographica. Section A, Foundations of crystallography vol. 58 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Structural characterization of Ba2YCu3O7 by high resolution transmission electron microscopy. [electronic resource] by Ourmazd, A Spence, J C Zuo, J M Li, C H Producer: 19890615 In: Journal of electron microscopy technique vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction. [electronic resource] by Martin, Y Rouviere, J L Zuo, J M Favre-Nicolin, V Producer: 20160415 In: Ultramicroscopy vol. 160 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Towards sub-A atomic resolution electron diffraction imaging of metallic nanoclusters: a simulation study of experimental parameters and reconstruction algorithms. [electronic resource] by Huang, W J Jiang, B Sun, R S Zuo, J M Producer: 20071030 In: Ultramicroscopy vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	On Closed-Shell Interactions, Polar Covalences, d Shell Holes, and Direct Images of Orbitals: The Case of Cuprite. [electronic resource] by Zuo, J M O'Keeffe, M Kim, M Spence, J C H Publication details: Angewandte Chemie (International ed. in English) Nov 2000 In: Angewandte Chemie (International ed. in English) vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	DNA Sensing using Nano-crystalline Surface Enhanced Al(2)O(3) Nanopore Sensors. [electronic resource] by Venkatesan, B M Shah, A B Zuo, J M Bashir, R Publication details: Advanced functional materials Apr 2010 In: Advanced functional materials vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Size- and shape-dependent energetics of nanocrystal interfaces: experiment and simulation. [electronic resource] by Bording, J K Li, B Q Shi, Y F Zuo, J M Producer: 20030819 In: Physical review letters vol. 90 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Use of quantitative convergent-beam electron diffraction in materials science. [electronic resource] by Holmestad, R Birkeland, C R Marthinsen, K Høier, R Zuo, J M Producer: 19990922 In: Microscopy research and technique vol. 46 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Atomic resolution imaging of a carbon nanotube from diffraction intensities. [electronic resource] by Zuo, J M Vartanyants, I Gao, M Zhang, R Nagahara, L A Producer: 20030616 In: Science (New York, N.Y.) vol. 300 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Charge density and chemical bonding in rutile, TiO2. [electronic resource] by Jiang, B Zuo, J M Jiang, N O'Keeffe, M Spence, J C H Producer: 20031002 In: Acta crystallographica. Section A, Foundations of crystallography vol. 59 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 30 results.