Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast. [electronic resource]

By: Contributor(s): Producer: 20130815Description: 88-95 p. digitalISSN:
  • 1879-2723
Subject(s): Online resources: In: Ultramicroscopy vol. 124
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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