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	1.	Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan method. [electronic resource] by Wang, Yu-Liang Zhao, Xue-Zeng Producer: 20090529 In: The Review of scientific instruments vol. 80 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Improved parallel scan method for nanofriction force measurement with atomic force microscopy. [electronic resource] by Wang, Yu-Liang Zhao, Xue-Zeng Zhou, Fa-Quan Producer: 20070619 In: The Review of scientific instruments vol. 78 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Application of 3 × 3 transformation matrix in the correction of three-dimensional AFM image tilts through coordinate transformation. [electronic resource] by Adebayo, Adedayo S Zhao, Xue-zeng Wang, Fei Zhou, Faquan Producer: 20110802 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopy. [electronic resource] by Zhou, Fa-Quan Zhao, Xue-Zeng Wang, Fei Wang, Yue-Yu Producer: 20110104 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)