APA

Zemlyanov D. Y., Jespersen M., Zakharov D. N., Hu J., Paul R., Kumar A., Pacley S., Glavin N., Saenz D., Smith K. C., Fisher T. S. & Voevodin A. A. (2018). Versatile technique for assessing thickness of 2D layered materials by XPS. : Nanotechnology.

Chicago

Zemlyanov Dmitry Y, Jespersen Michael, Zakharov Dmitry N, Hu Jianjun, Paul Rajib, Kumar Anurag, Pacley Shanee, Glavin Nicholas, Saenz David, Smith Kyle C, Fisher Timothy S and Voevodin Andrey A. 2018. Versatile technique for assessing thickness of 2D layered materials by XPS. : Nanotechnology.

Harvard

Zemlyanov D. Y., Jespersen M., Zakharov D. N., Hu J., Paul R., Kumar A., Pacley S., Glavin N., Saenz D., Smith K. C., Fisher T. S. and Voevodin A. A. (2018). Versatile technique for assessing thickness of 2D layered materials by XPS. : Nanotechnology.

MLA

Zemlyanov Dmitry Y, Jespersen Michael, Zakharov Dmitry N, Hu Jianjun, Paul Rajib, Kumar Anurag, Pacley Shanee, Glavin Nicholas, Saenz David, Smith Kyle C, Fisher Timothy S and Voevodin Andrey A. Versatile technique for assessing thickness of 2D layered materials by XPS. : Nanotechnology. 2018.