Effect of the electrode materials on the drain-bias stress instabilities of In-Ga-Zn-O thin-film transistors. [electronic resource]

By: Contributor(s): Producer: 20130318Description: 5369-74 p. digitalISSN:
  • 1944-8252
Online resources: In: ACS applied materials & interfaces vol. 4
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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