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	1.	Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces. [electronic resource] by Xu, Xueyang Zhang, Xiangchao Niu, Zhenqi Wang, Wei Xu, Min Publication details: Optics letters Sep 2019 In: Optics letters vol. 44 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Self-calibration of in situ monoscopic deflectometric measurement in precision optical manufacturing. [electronic resource] by Xu, Xueyang Zhang, Xiangchao Niu, Zhenqi Wang, Wei Zhu, Yifan Xu, Min Producer: 20190318 In: Optics express vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry. [electronic resource] by Niu, Zhenqi Xu, Xueyang Zhang, Xiangchao Wang, Wei Zhu, Yifan Ye, Junqiang Xu, Min Jiang, Xiangqian Publication details: Optics express Mar 2019 In: Optics express vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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