APA

Wameling A., Schäper M., Kunert J., Blaszkewicz M., van Thriel C., Zupanic M. & Seeber A. (20010222). Individual toluene exposure in rotary printing: increasing accuracy of estimation by linear models based on protocols of daily activity and other measures. : Biometrics.

Chicago

Wameling A, Schäper M, Kunert J, Blaszkewicz M, van Thriel C, Zupanic M and Seeber A. 20010222. Individual toluene exposure in rotary printing: increasing accuracy of estimation by linear models based on protocols of daily activity and other measures. : Biometrics.

Harvard

Wameling A., Schäper M., Kunert J., Blaszkewicz M., van Thriel C., Zupanic M. and Seeber A. (20010222). Individual toluene exposure in rotary printing: increasing accuracy of estimation by linear models based on protocols of daily activity and other measures. : Biometrics.

MLA

Wameling A, Schäper M, Kunert J, Blaszkewicz M, van Thriel C, Zupanic M and Seeber A. Individual toluene exposure in rotary printing: increasing accuracy of estimation by linear models based on protocols of daily activity and other measures. : Biometrics. 20010222.