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	1.	Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging. [electronic resource] by Carasso, Alfred S Vladár, András E Producer: 20151125 In: Journal of research of the National Institute of Standards and Technology vol. 119 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Fractional Diffusion, Low Exponent Lévy Stable Laws, and 'Slow Motion' Denoising of Helium Ion Microscope Nanoscale Imagery. [electronic resource] by Carasso, Alfred S Vladár, András E Producer: 20160222 In: Journal of research of the National Institute of Standards and Technology vol. 117 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Does your SEM really tell the truth?--How would you know? Part 1. [electronic resource] by Postek, Michael T Vladár, András E Producer: 20150414 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Modeling for accurate dimensional scanning electron microscope metrology: then and now. [electronic resource] by Postek, Michael T Vladár, András E Producer: 20111107 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation. [electronic resource] by Postek, Michael T Vladár, András E Publication details: Proceedings of SPIE--the International Society for Optical Engineering 2015 In: Proceedings of SPIE--the International Society for Optical Engineering vol. 9556 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its Mitigation. [electronic resource] by Postek, Michael T Vladár, András E Publication details: Proceedings of SPIE--the International Society for Optical Engineering 2015 In: Proceedings of SPIE--the International Society for Optical Engineering vol. 9636 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Real-time scanning charged-particle microscope image composition with correction of drift. [electronic resource] by Cizmar, Petr Vladár, András E Postek, Michael T Producer: 20110808 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry. [electronic resource] by Tondare, Vipin N Villarrubia, John S Vladár, András E Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Does your SEM really tell the truth? How would you know? Part 2. [electronic resource] by Postek, Michael T Vladár, András E Purushotham, Kavuri P Producer: 20150414 In: Scanning vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope. [electronic resource] by Postek, Michael T Vladár, András E Villarrubia, John S Muto, Atsushi Producer: 20180712 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Nanotip electron gun for the scanning electron microscope. [electronic resource] by Vladár, András E Radi, Zsolt Postek, Michael T Joy, David C Producer: 20060831 In: Scanning vol. 28 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype. [electronic resource] by Postek, Michael T Vladar, Andras E Jones, Samuel N Keery, William J Publication details: Journal of research of the National Institute of Standards and Technology In: Journal of research of the National Institute of Standards and Technology vol. 98 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research. [electronic resource] by Postek, Michael T Vladár, András E Lowney, Jeremiah R Keery, William J Producer: 20020829 In: Scanning vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Nondestructive shape process monitoring of three-dimensional high aspect ratio targets using through-focus scanning optical microscopy. [electronic resource] by Attota, Ravi Kiran Kang, Hyeonggon Scott, Keana Allen, Richard Vladar, Andras E Bunday, Benjamin Publication details: Measurement science & technology 12 2018 In: Measurement science & technology vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopy. [electronic resource] by Toth, Milos Lobo, Charlene J Knowles, W Ralph Phillips, Matthew R Postek, Michael T Vladár, András E Producer: 20070411 In: Nano letters vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement. [electronic resource] by Postek, Michael T Lowney, Jeremiah R Vladar, Andras E Keery, William J Marx, Egon Larrabee, Robert D Publication details: Journal of research of the National Institute of Standards and Technology In: Journal of research of the National Institute of Standards and Technology vol. 98 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopy. [electronic resource] by Barnes, Bryan M Sohn, Martin Y Goasmat, Francois Zhou, Hui Vladár, András E Silver, Richard M Arceo, Abraham Producer: 20140710 In: Optics express vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution. [electronic resource] by Montoro Bustos, Antonio R Purushotham, Kavuri P Possolo, Antonio Farkas, Natalia Vladár, András E Murphy, Karen E Winchester, Michael R Publication details: Analytical chemistry 12 2018 In: Analytical chemistry vol. 90 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing. [electronic resource] by Postek, Michael T Poster, Dianne L Vládar, András E Driscoll, Mark S LaVerne, Jay A Tsinas, Zois Al-Sheikhly, Mohamad I Publication details: Radiation physics and chemistry (Oxford, England : 1993) Feb 2018 In: Radiation physics and chemistry (Oxford, England : 1993) vol. 143 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined Regression. [electronic resource] by Henn, Mark-Alexander Silver, Richard M Villarrubia, John S Zhang, Nien Fan Zhou, Hui Barnes, Bryan M Ming, Bin Vladár, András E Publication details: Journal of micro/nanolithography, MEMS, and MOEMS : JM3 In: Journal of micro/nanolithography, MEMS, and MOEMS : JM3 vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 22 results.