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	1.	Local field effect on charge-capture/emission dynamics. [electronic resource] by Cheung, Kin P Veksler, Dmitry Campbell, Jason P Publication details: IEEE transactions on electron devices Dec 2017 In: IEEE transactions on electron devices vol. 64 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Microwave evaluation of electromigration susceptibility in advanced interconnects. [electronic resource] by Sunday, Christopher E Veksler, Dmitry Cheung, Kin C Obeng, Yaw S Publication details: Journal of applied physics Nov 2017 In: Journal of applied physics vol. 122 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Microwave Monitoring of Atmospheric Corrosion of Interconnects. [electronic resource] by Amoah, Papa K Veksler, Dmitry Sunday, Christopher E Moreau, Stéphane Bouchu, David Obeng, Yaw S Publication details: ECS journal of solid state science and technology : JSS 2018 In: ECS journal of solid state science and technology : JSS vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis. [electronic resource] by Georgiou, Vasileia Veksler, Dmitry Campbell, Jason P Shrestha, Pragya R Ryan, Jason T Ioannou, Dimitris E Cheung, Kin P Publication details: Advanced functional materials 2018 In: Advanced functional materials vol. 28 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Impact of RRAM Read Fluctuations on the Program-Verify Approach. [electronic resource] by Nminibapiel, David M Veksler, Dmitry Kim, J-H Shrestha, Pragya R Campbell, Jason P Ryan, Jason T Baumgart, Helmut Cheung, Kin P Publication details: IEEE electron device letters : a publication of the IEEE Electron Devices Society Jun 2017 In: IEEE electron device letters : a publication of the IEEE Electron Devices Society vol. 38 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)