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	1.	Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced deposition. [electronic resource] by van Dorp, W F Hagen, C W Crozier, P A Kruit, P Producer: 20121002 In: Nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscope. [electronic resource] by van Dorp, W F van Someren, B Hagen, C W Kruit, P Crozier, P A Producer: 20060628 In: Journal of microscopy vol. 221 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Ultrahigh resolution focused electron beam induced processing: the effect of substrate thickness. [electronic resource] by van Dorp, W F Lazić, I Beyer, A Gölzhäuser, A Wagner, J B Hansen, T W Hagen, C W Producer: 20110518 In: Nanotechnology vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Gold complexes for focused-electron-beam-induced deposition. [electronic resource] by van Dorp, W F Wu, X Mulders, J J L Harder, S Rudolf, P De Hosson, J T M Producer: 20150521 In: Langmuir : the ACS journal of surfaces and colloids vol. 30 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Nanometer-scale lithography on microscopically clean graphene. [electronic resource] by van Dorp, W F Zhang, X Feringa, B L Wagner, J B Hansen, T W De Hosson, J Th M Producer: 20120319 In: Nanotechnology vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validation. [electronic resource] by Huang, J Loeffler, M Muehle, U Moeller, W Mulders, J J L Kwakman, L F Tz Van Dorp, W F Zschech, E Producer: 20180807 In: Ultramicroscopy vol. 184 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Focused electron beam induced processing and the effect of substrate thickness revisited. [electronic resource] by van Dorp, W F Beyer, A Mainka, M Gölzhäuser, A Hansen, T W Wagner, J B Hagen, C W De Hosson, J Th M Producer: 20140527 In: Nanotechnology vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Selective functionalization of patterned glass surfaces. [electronic resource] by Ploetz, E Visser, B Slingenbergh, W Evers, K Martinez-Martinez, D Pei, Y T Feringa, B L De Hosson, J Th M Cordes, T van Dorp, W F Publication details: Journal of materials chemistry. B May 2014 In: Journal of materials chemistry. B vol. 2 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)