APA

Tamura N., MacDowell A. A., Spolenak R., Valek B. C., Bravman J. C., Brown W. L., Celestre R. S., Padmore H. A., Batterman B. W. & Patel J. R. (20030424). Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. : Journal of synchrotron radiation.

Chicago

Tamura N, MacDowell A A, Spolenak R, Valek B C, Bravman J C, Brown W L, Celestre R S, Padmore H A, Batterman B W and Patel J R. 20030424. Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. : Journal of synchrotron radiation.

Harvard

Tamura N., MacDowell A. A., Spolenak R., Valek B. C., Bravman J. C., Brown W. L., Celestre R. S., Padmore H. A., Batterman B. W. and Patel J. R. (20030424). Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. : Journal of synchrotron radiation.

MLA

Tamura N, MacDowell A A, Spolenak R, Valek B C, Bravman J C, Brown W L, Celestre R S, Padmore H A, Batterman B W and Patel J R. Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. : Journal of synchrotron radiation. 20030424.