Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. [electronic resource]

By: Contributor(s): Publication details: Journal of synchrotron radiation Sep 2017Description: 1017-1023 p. digitalISSN:
  • 1600-5775
Online resources: In: Journal of synchrotron radiation vol. 24
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Publication Type: Journal Article

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