APA

Wirtz T., Fleming Y., Gerard M., Gysin U., Glatzel T., Meyer E., Wegmann U., Maier U., Odriozola A. H. & Uehli D. (20121113). Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. : The Review of scientific instruments.

Chicago

Wirtz Tom, Fleming Yves, Gerard Mathieu, Gysin Urs, Glatzel Thilo, Meyer Ernst, Wegmann Urs, Maier Urs, Odriozola Aitziber Herrero and Uehli Daniel. 20121113. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. : The Review of scientific instruments.

Harvard

Wirtz T., Fleming Y., Gerard M., Gysin U., Glatzel T., Meyer E., Wegmann U., Maier U., Odriozola A. H. and Uehli D. (20121113). Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. : The Review of scientific instruments.

MLA

Wirtz Tom, Fleming Yves, Gerard Mathieu, Gysin Urs, Glatzel Thilo, Meyer Ernst, Wegmann Urs, Maier Urs, Odriozola Aitziber Herrero and Uehli Daniel. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. : The Review of scientific instruments. 20121113.