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	1.	When structural noise is the signal: speckle statistics in fluctuation electron microscopy. [electronic resource] by Treacy, M M J Producer: 20070220 In: Ultramicroscopy vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Examination of a polycrystalline thin-film model to explore the relation between probe size and structural correlation length in fluctuation electron microscopy. [electronic resource] by Treacy, M M J Gibson, J M Producer: 20120516 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Fluctuation microscopy analysis of amorphous silicon models. [electronic resource] by Gibson, J M Treacy, M M J Producer: 20180723 In: Ultramicroscopy vol. 176 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	The local structure of amorphous silicon. [electronic resource] by Treacy, M M J Borisenko, K B Producer: 20120312 In: Science (New York, N.Y.) vol. 335 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	A surprise in the first Born approximation for electron scattering. [electronic resource] by Treacy, M M J Van Dyck, D Producer: 20130104 In: Ultramicroscopy vol. 119 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Density of mechanisms within the flexibility window of zeolites. [electronic resource] by Kapko, V Dawson, C Rivin, I Treacy, M M J Producer: 20120705 In: Physical review letters vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Medium-range order in molecular materials: fluctuation electron microscopy for detecting fullerenes in disordered carbons. [electronic resource] by Zhao, G Buseck, P R Rougée, A Treacy, M M J Producer: 20090317 In: Ultramicroscopy vol. 109 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Flexibility of ideal zeolite frameworks. [electronic resource] by Kapko, V Dawson, C Treacy, M M J Thorpe, M F Producer: 20101029 In: Physical chemistry chemical physics : PCCP vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Flexibility mechanisms in ideal zeolite frameworks. [electronic resource] by Treacy, M M J Dawson, C J Kapko, V Rivin, I Producer: 20140227 In: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences vol. 372 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Substantial crystalline topology in amorphous silicon. [electronic resource] by Gibson, J M Treacy, M M J Sun, T Zaluzec, N J Producer: 20110111 In: Physical review letters vol. 105 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	The flexibility window in zeolites. [electronic resource] by Sartbaeva, Asel Wells, Stephen A Treacy, M M J Thorpe, M F Producer: 20070111 In: Nature materials vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materials. [electronic resource] by Fan, L Paterson, D McNulty, I Treacy, M M J Gibson, J M Producer: 20070328 In: Journal of microscopy vol. 225 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature. [electronic resource] by Voyles, P M Gerbi, J E Treacy, M M Gibson, J M Abelson, J R Producer: 20010719 In: Physical review letters vol. 86 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials. [electronic resource] by Collins, S M Leary, R K Midgley, P A Tovey, R Benning, M Schönlieb, C-B Rez, P Treacy, M M J Producer: 20180205 In: Physical review letters vol. 119 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)