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Results of search for 'au:"Treacy, M M"'
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Authors
Abelson, J R
Benning, M
Borisenko, K B
Buseck, P R
Collins, S M
Dawson, C
Dawson, C J
Fan, L
Gerbi, J E
Gibson, J M
Kapko, V
Leary, R K
McNulty, I
Midgley, P A
Paterson, D
Rez, P
Rivin, I
Rougée, A
Thorpe, M F
Treacy, M M J
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Your search returned 14 results.
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1.
When structural noise is the signal: speckle statistics in fluctuation electron microscopy.
[electronic resource]
by
Treacy, M M J
Producer:
20070220
In:
Ultramicroscopy
vol. 107
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2.
Examination of a polycrystalline thin-film model to explore the relation between probe size and structural correlation length in fluctuation electron microscopy.
[electronic resource]
by
Treacy, M M J
Gibson, J M
Producer:
20120516
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
vol. 18
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3.
Fluctuation microscopy analysis of amorphous silicon models.
[electronic resource]
by
Gibson, J M
Treacy, M M J
Producer:
20180723
In:
Ultramicroscopy
vol. 176
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4.
The local structure of amorphous silicon.
[electronic resource]
by
Treacy, M M J
Borisenko, K B
Producer:
20120312
In:
Science (New York, N.Y.)
vol. 335
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5.
A surprise in the first Born approximation for electron scattering.
[electronic resource]
by
Treacy, M M J
Van Dyck, D
Producer:
20130104
In:
Ultramicroscopy
vol. 119
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6.
Density of mechanisms within the flexibility window of zeolites.
[electronic resource]
by
Kapko, V
Dawson, C
Rivin, I
Treacy, M M J
Producer:
20120705
In:
Physical review letters
vol. 107
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7.
Medium-range order in molecular materials: fluctuation electron microscopy for detecting fullerenes in disordered carbons.
[electronic resource]
by
Zhao, G
Buseck, P R
Rougée, A
Treacy, M M J
Producer:
20090317
In:
Ultramicroscopy
vol. 109
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8.
Flexibility of ideal zeolite frameworks.
[electronic resource]
by
Kapko, V
Dawson, C
Treacy, M M J
Thorpe, M F
Producer:
20101029
In:
Physical chemistry chemical physics : PCCP
vol. 12
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9.
Flexibility mechanisms in ideal zeolite frameworks.
[electronic resource]
by
Treacy, M M J
Dawson, C J
Kapko, V
Rivin, I
Producer:
20140227
In:
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
vol. 372
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10.
Substantial crystalline topology in amorphous silicon.
[electronic resource]
by
Gibson, J M
Treacy, M M J
Sun, T
Zaluzec, N J
Producer:
20110111
In:
Physical review letters
vol. 105
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11.
The flexibility window in zeolites.
[electronic resource]
by
Sartbaeva, Asel
Wells, Stephen A
Treacy, M M J
Thorpe, M F
Producer:
20070111
In:
Nature materials
vol. 5
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12.
Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materials.
[electronic resource]
by
Fan, L
Paterson, D
McNulty, I
Treacy, M M J
Gibson, J M
Producer:
20070328
In:
Journal of microscopy
vol. 225
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13.
Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature.
[electronic resource]
by
Voyles, P M
Gerbi, J E
Treacy, M M
Gibson, J M
Abelson, J R
Producer:
20010719
In:
Physical review letters
vol. 86
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14.
Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials.
[electronic resource]
by
Collins, S M
Leary, R K
Midgley, P A
Tovey, R
Benning, M
Schönlieb, C-B
Rez, P
Treacy, M M J
Producer:
20180205
In:
Physical review letters
vol. 119
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