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	1.	Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance. [electronic resource] by Czerwinski, A Pluska, M Ratajczak, J Szerling, A Katcki, J Producer: 20100830 In: Journal of microscopy vol. 237 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers. [electronic resource] by Łaszcz, A Czerwinski, A Ratajczak, J Szerling, A Phillipp, F Van Aken, P A Katcki, J Producer: 20100830 In: Journal of microscopy vol. 237 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Monolithic high-index contrast grating: a material independent high-reflectance VCSEL mirror. [electronic resource] by Gębski, M Dems, M Szerling, A Motyka, M Marona, L Kruszka, R Urbańczyk, D Walczakowski, M Pałka, N Wójcik-Jedlińska, A Wang, Q J Zhang, D H Bugajski, M Wasiak, M Czyszanowski, T Producer: 20150710 In: Optics express vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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