APA

Sun J., Park J. H., Yang T., Choi H., Cui Y., Choi E., Kim A., Oh L. S., Lee S. J., Park H., Kim C. H., Kim S., Son H., Lee D. H. & Pyo S. G. (20130807). Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration. : Journal of nanoscience and nanotechnology.

Chicago

Sun Jong-Won, Park Ji Hwan, Yang Taek-Seung, Choi Heesoo, Cui Yinhua, Choi Eunmi, Kim Areum, Oh Lee Seul, Lee Sun Jae, Park Hyunjin, Kim Chang Hyun, Kim Soo-Kil, Son Hyungbin, Lee Dong Hyun and Pyo Sung Gyu. 20130807. Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration. : Journal of nanoscience and nanotechnology.

Harvard

Sun J., Park J. H., Yang T., Choi H., Cui Y., Choi E., Kim A., Oh L. S., Lee S. J., Park H., Kim C. H., Kim S., Son H., Lee D. H. and Pyo S. G. (20130807). Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration. : Journal of nanoscience and nanotechnology.

MLA

Sun Jong-Won, Park Ji Hwan, Yang Taek-Seung, Choi Heesoo, Cui Yinhua, Choi Eunmi, Kim Areum, Oh Lee Seul, Lee Sun Jae, Park Hyunjin, Kim Chang Hyun, Kim Soo-Kil, Son Hyungbin, Lee Dong Hyun and Pyo Sung Gyu. Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration. : Journal of nanoscience and nanotechnology. 20130807.