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	1.	Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X-ray Nanodiffraction. [electronic resource] by Richard, Marie-Ingrid Zoellner, Marvin H Chahine, Gilbert A Zaumseil, Peter Capellini, Giovanni Häberlen, Maik Storck, Peter Schülli, Tobias U Schroeder, Thomas Producer: 20160401 In: ACS applied materials & interfaces vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy. [electronic resource] by Zoellner, Marvin H Richard, Marie-Ingrid Chahine, Gilbert A Zaumseil, Peter Reich, Christian Capellini, Giovanni Montalenti, Francesco Marzegalli, Anna Xie, Ya-Hong Schülli, Tobias U Häberlen, Maik Storck, Peter Schroeder, Thomas Producer: 20150820 In: ACS applied materials & interfaces vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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