APA

Terekhov V. A., Tetelbaum D. I., Spirin D. E., Pankov K. N., Mikhailov A. N., Belov A. I., Ershov A. V. & Turishchev S. Y. (20140815). X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals. : Journal of synchrotron radiation.

Chicago

Terekhov V A, Tetelbaum D I, Spirin D E, Pankov K N, Mikhailov A N, Belov A I, Ershov A V and Turishchev S Yu. 20140815. X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals. : Journal of synchrotron radiation.

Harvard

Terekhov V. A., Tetelbaum D. I., Spirin D. E., Pankov K. N., Mikhailov A. N., Belov A. I., Ershov A. V. and Turishchev S. Y. (20140815). X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals. : Journal of synchrotron radiation.

MLA

Terekhov V A, Tetelbaum D I, Spirin D E, Pankov K N, Mikhailov A N, Belov A I, Ershov A V and Turishchev S Yu. X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals. : Journal of synchrotron radiation. 20140815.