Quantitative compositional profiling of conjugated quantum dots with single atomic layer depth resolution via time-of-flight medium-energy ion scattering spectroscopy. [electronic resource]

By: Contributor(s): Producer: 20140717Description: 1091-7 p. digitalISSN:
  • 1520-6882
Online resources: In: Analytical chemistry vol. 86
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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