APA

Filatova E. O., Kozhevnikov I. V., Sokolov A. A., Ubyivovk E. V., Yulin S., Gorgoi M. & Schäfers F. (2012). Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO. : Science and technology of advanced materials.

Chicago

Filatova Elena O, Kozhevnikov Igor V, Sokolov Andrey A, Ubyivovk Evgeniy V, Yulin Sergey, Gorgoi Mihaela and Schäfers Franz. 2012. Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO. : Science and technology of advanced materials.

Harvard

Filatova E. O., Kozhevnikov I. V., Sokolov A. A., Ubyivovk E. V., Yulin S., Gorgoi M. and Schäfers F. (2012). Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO. : Science and technology of advanced materials.

MLA

Filatova Elena O, Kozhevnikov Igor V, Sokolov Andrey A, Ubyivovk Evgeniy V, Yulin Sergey, Gorgoi Mihaela and Schäfers Franz. Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO. : Science and technology of advanced materials. 2012.