APA

Gopon P., Fournelle J., Sobol P. E. & Llovet X. (20140618). Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-rays. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Gopon Phillip, Fournelle John, Sobol Peter E and Llovet Xavier. 20140618. Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-rays. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Gopon P., Fournelle J., Sobol P. E. and Llovet X. (20140618). Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-rays. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Gopon Phillip, Fournelle John, Sobol Peter E and Llovet Xavier. Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-rays. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20140618.