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Authors
- Blanchard, Philippe
- Bricaud, Quentin
- Clément, Nicolas
- Deresmes, Dominique
- Fujiwara, Akira
- Godey, Sylvie
- Hardouin, Marie
- Karpe, Sandrine
- Lenfant, Stéphane
- Nishiguchi, Katsuhiko
- Oçafrain, Maïténa
- Patriarche, Gilles
- Rochefort, Alain
- Roncali, Jean
- Smaali, Kacem
- Tran, Truong Khoa
- Troadec, David
- Vaurette, François
- Vuillaume, Dominique
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Topics
- Data Interpretation, Statistical
- Electric Conductivity
- Equipment Design
- Equipment Failure Analysis
- Gold
- Materials Testing
- Metal Nanoparticles
- Microelectrodes
- Microscopy, Atomic Force
- Microscopy, Electron, Scanning
- Nanoparticles
- Nanotechnology
- Particle Size
- Silicon Dioxide
- chemistry
- instrumentation
- methods
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