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Results of search for 'au:"Siller, Brian M"'
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Authors
Hodges, James N
Jenkins, Paul A
Kreckel, Holger
McCall, Benjamin J
Mills, Andrew A
Pearson, Jessica M
Perera, Manori
Perry, Adam J
Porambo, Michael W
Siller, Brian M
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Equipment Design
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Optical Devices
Refractometry
Spectrum Analysis
Surface Plasmon Resonance
instrumentation
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English
Your search returned 6 results.
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1.
Cavity-enhanced velocity modulation spectroscopy.
[electronic resource]
by
Siller, Brian M
Mills, Andrew A
McCall, Benjamin J
Producer:
20100812
In:
Optics letters
vol. 35
Online resources:
Available from publisher's website
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No items available.
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2.
Noise immune cavity enhanced optical heterodyne velocity modulation spectroscopy.
[electronic resource]
by
Siller, Brian M
Porambo, Michael W
Mills, Andrew A
McCall, Benjamin J
Producer:
20120319
In:
Optics express
vol. 19
Online resources:
Available from publisher's website
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No items available.
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3.
Broadly tunable mid-infrared noise-immune cavity-enhanced optical heterodyne molecular spectrometer.
[electronic resource]
by
Porambo, Michael W
Siller, Brian M
Pearson, Jessica M
McCall, Benjamin J
Producer:
20130807
In:
Optics letters
vol. 37
Online resources:
Available from publisher's website
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4.
Indirect rotational spectroscopy of HCO+.
[electronic resource]
by
Siller, Brian M
Hodges, James N
Perry, Adam J
McCall, Benjamin J
Producer:
20140916
In:
The journal of physical chemistry. A
vol. 117
Online resources:
Available from publisher's website
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5.
High-precision and high-accuracy rovibrational spectroscopy of molecular ions.
[electronic resource]
by
Hodges, James N
Perry, Adam J
Jenkins, Paul A
Siller, Brian M
McCall, Benjamin J
Producer:
20140530
In:
The Journal of chemical physics
vol. 139
Online resources:
Available from publisher's website
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6.
Ultra-sensitive high-precision spectroscopy of a fast molecular ion beam.
[electronic resource]
by
Mills, Andrew A
Siller, Brian M
Porambo, Michael W
Perera, Manori
Kreckel, Holger
McCall, Benjamin J
Producer:
20120404
In:
The Journal of chemical physics
vol. 135
Online resources:
Available from publisher's website
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