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	1.	Substrate atom enriched carbon nanostructures fabricated by focused electron beam induced deposition. [electronic resource] by Tripathi, Sarvesh K Shukla, Neeraj Kulkarni, Vishwas N Producer: 20121002 In: Nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Exploring a new strategy for nanofabrication: deposition by scattered Ga ions using focused ion beam. [electronic resource] by Tripathi, Sarvesh K Shukla, Neeraj Kulkarni, Vishwas N Producer: 20090608 In: Nanotechnology vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Controlled manipulation of carbon nanopillars and cantilevers by focused ion beam. [electronic resource] by Tripathi, Sarvesh K Shukla, Neeraj Dhamodaran, S Kulkarni, Vishwas N Producer: 20121002 In: Nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	The out of beam sight effects in focused ion beam processing. [electronic resource] by Tripathi, Sarvesh K Shukla, Neeraj Rajput, Nitul S Kulkarni, Vishwas N Producer: 20090820 In: Nanotechnology vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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