Electrical isolation of dislocations in Ge layers on Si(001) substrates through CMOS-compatible suspended structures. [electronic resource]

By: Contributor(s): Publication details: Science and technology of advanced materials Oct 2012Description: 055002 p. digitalISSN:
  • 1468-6996
Online resources: In: Science and technology of advanced materials vol. 13
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Publication Type: Journal Article

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