APA

Bordes A., De Vito E., Haon C., Secouard C., Montani A. & Marcus P. (20160425). Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM. : ACS applied materials & interfaces.

Chicago

Bordes Arnaud, De Vito Eric, Haon Cédric, Secouard Christophe, Montani Alexandre and Marcus Philippe. 20160425. Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM. : ACS applied materials & interfaces.

Harvard

Bordes A., De Vito E., Haon C., Secouard C., Montani A. and Marcus P. (20160425). Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM. : ACS applied materials & interfaces.

MLA

Bordes Arnaud, De Vito Eric, Haon Cédric, Secouard Christophe, Montani Alexandre and Marcus Philippe. Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM. : ACS applied materials & interfaces. 20160425.