APA

Allen K. W., Scott M. M., Reid D. R., Bean J. A., Ellis J. D., Morris A. P. & Marsh J. M. (20171207). An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity. : The Review of scientific instruments.

Chicago

Allen Kenneth W, Scott Mark M, Reid David R, Bean Jeffrey A, Ellis Jeremy D, Morris Andrew P and Marsh Jeramy M. 20171207. An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity. : The Review of scientific instruments.

Harvard

Allen K. W., Scott M. M., Reid D. R., Bean J. A., Ellis J. D., Morris A. P. and Marsh J. M. (20171207). An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity. : The Review of scientific instruments.

MLA

Allen Kenneth W, Scott Mark M, Reid David R, Bean Jeffrey A, Ellis Jeremy D, Morris Andrew P and Marsh Jeramy M. An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity. : The Review of scientific instruments. 20171207.