APA

Schune C., Yonger M., Bresson B., Fretigny C., Guy L., Chaussée T., Lequeux F., Montes H. & Verneuil E. (2019). Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts. : Langmuir : the ACS journal of surfaces and colloids.

Chicago

Schune Claire, Yonger Marc, Bresson Bruno, Fretigny Christian, Guy Laurent, Chaussée Thomas, Lequeux François, Montes Hélène and Verneuil Emilie. 2019. Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts. : Langmuir : the ACS journal of surfaces and colloids.

Harvard

Schune C., Yonger M., Bresson B., Fretigny C., Guy L., Chaussée T., Lequeux F., Montes H. and Verneuil E. (2019). Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts. : Langmuir : the ACS journal of surfaces and colloids.

MLA

Schune Claire, Yonger Marc, Bresson Bruno, Fretigny Christian, Guy Laurent, Chaussée Thomas, Lequeux François, Montes Hélène and Verneuil Emilie. Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts. : Langmuir : the ACS journal of surfaces and colloids. 2019.