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	1.	Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscope. [electronic resource] by Volkenandt, T Müller, E Hu, D Z Schaadt, D M Gerthsen, D Producer: 20110104 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Growth and Characterization of [electronic resource] by Lin, Yu-Chiao Lo, Ikai Shih, Hui-Chun Chou, Mitch M C Schaadt, D M Producer: 20180306 In: Scanning vol. 2017 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	A portable molecular beam epitaxy system for in situ x-ray investigations at synchrotron beamlines. [electronic resource] by Slobodskyy, T Schroth, P Grigoriev, D Minkevich, A A Hu, D Z Schaadt, D M Baumbach, T Producer: 20130416 In: The Review of scientific instruments vol. 83 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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