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	1.	Strain distribution in single, suspended germanium nanowires studied using nanofocused x-rays. [electronic resource] by Keplinger, Mario Grifone, Raphael Greil, Johannes Kriegner, Dominik Persson, Johan Lugstein, Alois Schülli, Tobias Stangl, Julian Producer: 20160504 In: Nanotechnology vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Identifying Copper Vacancies and Their Role in the CuO Based Photocathode for Water Splitting. [electronic resource] by Wang, Zhiliang Zhang, Lei Schülli, Tobias U Bai, Yang Monny, Sabiha Akter Du, Aiju Wang, Lianzhou Publication details: Angewandte Chemie (International ed. in English) Dec 2019 In: Angewandte Chemie (International ed. in English) vol. 58 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Intergrowth structure and aluminium zoning of a zeolite ZSM-5 crystal as resolved by synchrotron-based micro X-ray diffraction imaging. [electronic resource] by Ristanović, Zoran Hofmann, Jan P Deka, Upakul Schülli, Tobias U Rohnke, Marcus Beale, Andrew M Weckhuysen, Bert M Producer: 20140711 In: Angewandte Chemie (International ed. in English) vol. 52 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. [electronic resource] by Bussone, Genziana Schott, Rüdiger Biermanns, Andreas Davydok, Anton Reuter, Dirk Carbone, Gerardina Schülli, Tobias U Wieck, Andreas D Pietsch, Ullrich Publication details: Journal of applied crystallography Aug 2013 In: Journal of applied crystallography vol. 46 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Thermal diffuse scattering as a probe of large-wave-vector phonons in silicon nanostructures. [electronic resource] by Gopalakrishnan, Gokul Holt, Martin V McElhinny, Kyle M Spalenka, Josef W Czaplewski, David A Schülli, Tobias U Evans, Paul G Producer: 20150512 In: Physical review letters vol. 110 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Crystal Phase Transitions in the Shell of PbS/CdS Core/Shell Nanocrystals Influences Photoluminescence Intensity. [electronic resource] by Lechner, Rainer T Fritz-Popovski, Gerhard Yarema, Maksym Heiss, Wolfgang Hoell, Armin Schülli, Tobias U Primetzhofer, Daniel Eibelhuber, Martin Paris, Oskar Publication details: Chemistry of materials : a publication of the American Chemical Society Oct 2014 In: Chemistry of materials : a publication of the American Chemical Society vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in One. [electronic resource] by Ristanović, Zoran Hofmann, Jan P Richard, Marie-Ingrid Jiang, Tao Chahine, Gilbert A Schülli, Tobias U Meirer, Florian Weckhuysen, Bert M Publication details: Angewandte Chemie (Weinheim an der Bergstrasse, Germany) 06 2016 In: Angewandte Chemie (Weinheim an der Bergstrasse, Germany) vol. 128 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in One. [electronic resource] by Ristanović, Zoran Hofmann, Jan P Richard, Marie-Ingrid Jiang, Tao Chahine, Gilbert A Schülli, Tobias U Meirer, Florian Weckhuysen, Bert M Producer: 20180726 In: Angewandte Chemie (International ed. in English) vol. 55 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X-ray Nanodiffraction. [electronic resource] by Richard, Marie-Ingrid Zoellner, Marvin H Chahine, Gilbert A Zaumseil, Peter Capellini, Giovanni Häberlen, Maik Storck, Peter Schülli, Tobias U Schroeder, Thomas Producer: 20160401 In: ACS applied materials & interfaces vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Real- and [electronic resource] by Dolabella, Simone Frison, Ruggero Chahine, Gilbert A Richter, Carsten Schulli, Tobias U Tasdemir, Zuhal Alaca, B Erdem Leblebici, Yusuf Dommann, Alex Neels, Antonia Publication details: Journal of applied crystallography Feb 2020 In: Journal of applied crystallography vol. 53 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates. [electronic resource] by Bussone, Genziana Schäfer-Eberwein, Heiko Dimakis, Emmanouil Biermanns, Andreas Carbone, Dina Tahraoui, Abbes Geelhaar, Lutz Bolívar, Peter Haring Schülli, Tobias U Pietsch, Ullrich Producer: 20150625 In: Nano letters vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Correlation of Optical, Structural, and Compositional Properties with V-Pit Distribution in InGaN/GaN Multiquantum Wells. [electronic resource] by Zoellner, Marvin Hartwig Chahine, Gilbert André Lahourcade, Lise Mounir, Christian Manganelli, Costanza Lucia Schülli, Tobias Urs Schwarz, Ulrich Theodor Zeisel, Roland Schroeder, Thomas Publication details: ACS applied materials & interfaces Jun 2019 In: ACS applied materials & interfaces vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. [electronic resource] by Schäfer, Norbert Wilkinson, Angus J Schmid, Thomas Winkelmann, Aimo Chahine, Gilbert A Schülli, Tobias U Rissom, Thorsten Marquardt, Julien Schorr, Susan Abou-Ras, Daniel Producer: 20180126 In: Ultramicroscopy vol. 169 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping. [electronic resource] by Richard, Marie-Ingrid Cornelius, Thomas W Lauraux, Florian Molin, Jean-Baptiste Kirchlechner, Christoph Leake, Steven J Carnis, Jérôme Schülli, Tobias U Thilly, Ludovic Thomas, Olivier Publication details: Small (Weinheim an der Bergstrasse, Germany) Feb 2020 In: Small (Weinheim an der Bergstrasse, Germany) vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Growth Mechanism and Surface State of CuInS [electronic resource] by Gromova, Marina Lefrançois, Aurélie Vaure, Louis Agnese, Fabio Aldakov, Dmitry Maurice, Axel Djurado, David Lebrun, Colette de Geyer, Arnaud Schülli, Tobias U Pouget, Stéphanie Reiss, Peter Producer: 20180608 In: Journal of the American Chemical Society vol. 139 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Inversion Domain Boundaries in GaN Wires Revealed by Coherent Bragg Imaging. [electronic resource] by Labat, Stéphane Richard, Marie-Ingrid Dupraz, Maxime Gailhanou, Marc Beutier, Guillaume Verdier, Marc Mastropietro, Francesca Cornelius, Thomas W Schülli, Tobias U Eymery, Joël Thomas, Olivier Producer: 20160108 In: ACS nano vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions. [electronic resource] by Carnis, Jérôme Gao, Lu Labat, Stéphane Kim, Young Yong Hofmann, Jan P Leake, Steven J Schülli, Tobias U Hensen, Emiel J M Thomas, Olivier Richard, Marie-Ingrid Publication details: Scientific reports Nov 2019 In: Scientific reports vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy. [electronic resource] by Zoellner, Marvin H Richard, Marie-Ingrid Chahine, Gilbert A Zaumseil, Peter Reich, Christian Capellini, Giovanni Montalenti, Francesco Marzegalli, Anna Xie, Ya-Hong Schülli, Tobias U Häberlen, Maik Storck, Peter Schroeder, Thomas Producer: 20150820 In: ACS applied materials & interfaces vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging. [electronic resource] by Richard, Marie-Ingrid Fernández, Sara Eymery, Joël Hofmann, Jan Philipp Gao, Lu Carnis, Jérôme Labat, Stéphane Favre-Nicolin, Vincent Hensen, Emiel J M Thomas, Olivier Schülli, Tobias U Leake, Steven J Producer: 20180731 In: Nanoscale vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	In situ structural evolution of single particle model catalysts under ambient pressure reaction conditions. [electronic resource] by Fernández, Sara Gao, Lu Hofmann, Jan Philipp Carnis, Jérôme Labat, Stéphane Chahine, Gilbert A van Hoof, Arno J F Verhoeven, M W G M Tiny Schülli, Tobias U Hensen, Emiel J M Thomas, Olivier Richard, Marie-Ingrid Producer: 20181220 In: Nanoscale vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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