Your search returned 6 results.

Results
	1.	Atom probe characterization of precipitation in an aged Cu-Ni-P alloy. [electronic resource] by Aruga, Yasuhiro Saxey, David W Marquis, Emmanuelle A Cerezo, Alfred Smith, George D W Producer: 20111003 In: Ultramicroscopy vol. 111 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Analysis of Natural Rutile (TiO2) by Laser-assisted Atom Probe Tomography. [electronic resource] by Verberne, Rick Saxey, David W Reddy, Steven M Rickard, William D A Fougerouse, Denis Clark, Chris Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 04 2019 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Nanogeochronology of discordant zircon measured by atom probe microscopy of Pb-enriched dislocation loops. [electronic resource] by Peterman, Emily M Reddy, Steven M Saxey, David W Snoeyenbos, David R Rickard, William D A Fougerouse, Denis Kylander-Clark, Andrew R C Producer: 20180125 In: Science advances vol. 2 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Cr-spinel records metasomatism not petrogenesis of mantle rocks. [electronic resource] by Gamal El Dien, Hamed Arai, Shoji Doucet, Luc-Serge Li, Zheng-Xiang Kil, Youngwoo Fougerouse, Denis Reddy, Steven M Saxey, David W Hamdy, Mohamed Publication details: Nature communications 11 2019 In: Nature communications vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows. [electronic resource] by Rickard, William D A Reddy, Steven M Saxey, David W Fougerouse, Denis Timms, Nicholas E Daly, Luke Peterman, Emily Cavosie, Aaron J Jourdan, Fred Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Aug 2020 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography. [electronic resource] by Pedrazzini, Stella London, Andrew J Gault, Baptiste Saxey, David Speller, Susannah Grovenor, Chris R M Danaie, Mohsen Moody, Michael P Edmondson, Philip D Bagot, Paul A J Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)