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	1.	Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography. [electronic resource] by Roussel, Manuel Talbot, Etienne Gourbilleau, Fabrice Pareige, Philippe Producer: 20121002 In: Nanoscale research letters vol. 6 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Atomic scale investigation of silicon nanowires and nanoclusters. [electronic resource] by Roussel, Manuel Chen, Wanghua Talbot, Etienne Lardé, Rodrigue Cadel, Emmanuel Gourbilleau, Fabrice Grandidier, Bruno Stiévenard, Didier Pareige, Philippe Producer: 20121002 In: Nanoscale research letters vol. 6 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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