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Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905). [electronic resource] by
- Marinenko, Ryna B
- Turner, Shirley
- Simons, David S
- Rabb, Savelas A
- Zeisler, Rolf L
- Yu, Lee L
- Newbury, Dale E
- Paul, Rick L
- Ritchie, Nicholas W M
- Leigh, Stefan D
- Winchester, Michael R
- Richter, Lee J
- Meier, Douglas C
- Scott, Keana C K
- Klinedinst, Donna
- Small, John A
Producer: 20100312
In:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16
Availability: No items available.
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